Tess Remy Liegeois (Reigstration# 5402441) is an attorney registered with New York State, Office of Court Administration. The admitted year is 2016.
Registration Number | 5402441 |
Full Name | TESS REMY LIEGEOIS |
Company / Organization | Davis Polk & Wardwell |
Address |
New York NY 10017-3904 United States of America |
County | New York |
Phone Number | (239) 595-8156 |
Law School | Emory University School of Law |
Judicial Department of Admission | Third Department (seated in Albany) |
Year Admitted | 2016 |
Status | Currently registered |
Company / Organization Name | Davis Polk & Wardwell |
Name | Company / Organization | Address |
---|---|---|
Caroline Grace Armstrong | Davis Polk & Wardwell | New York, NY 10017-3904, United States of America |
Chan Tov Mcnamarah | Davis Polk & Wardwell | New York, NY 10017-3904, United States of America |
Marisa Elena Bannon | Davis Polk & Wardwell | New York, NY 10017-3904, United States of America |
Anna Lee Whisenant | Davis Polk & Wardwell | New York, NY 10017-3904, United States of America |
Alexander Jihoon Yang | Davis Polk & Wardwell | New York, NY 10017-3904, United States of America |
Lik Hang Jim | Davis Polk & Wardwell | Hong Kong Sar, HONG KONG |
Shaoting Qin | Davis Polk & Wardwell | New York, NY 10017-3904, United States of America |
Jesse Aaron Lempel | Davis Polk & Wardwell | New York, NY 10017-3904, United States of America |
Edna Rasie Turay | Davis Polk & Wardwell | New York, NY 10017-3904, United States of America |
Christine Boyun Choi | Davis Polk & Wardwell | New York, NY 10017-3904, United States of America |
Find all attorneys in Davis Polk & Wardwell |
Law School | Emory University School of Law |
Name | Company / Organization | Address |
---|---|---|
Matthew Breen | New York, NY 10036-6728, UNITED STATES OF AMERICA | |
Jiahui Wang | Wilmington, DE 19801-1658, UNITED STATES OF AMERICA | |
Henry Forrest Flemming Iii | New York, NY 10036-7709, UNITED STATES OF AMERICA | |
Amanda Rachel Nowak | Central Islip, NY 11722-4437, UNITED STATES OF AMERICA | |
Matthew Benjamin Freifeld | New York, NY 10001-2163, UNITED STATES OF AMERICA | |
Troy G Mattila | New York, NY 10281-1052, UNITED STATES OF AMERICA | |
Jiao Jiang | Shanghai, CHINA | |
Adam David Bernstein | New York, NY 10153-0023, UNITED STATES OF AMERICA | |
Mirna Youssef | New York, NY 10007-2601, UNITED STATES OF AMERICA | |
Seokwon Lee | Atlanta, GA 30363-1029, UNITED STATES OF AMERICA | |
Find all attorneys from Emory University School of Law |
Street Address |
|
City | New York |
State | NY |
Zip | 10017 |
Country | United States of America |
Name | Company / Organization | Address |
---|---|---|
William Benton Lewis Jr. | WEIL, GOTSHAL & MANGES LLP | New York, 10153 |
Kyle Donald Winnick | Chamberlain, Hrdlicka, White, Williams & Aughtry | New York, GA 30303, United States of America |
Noran Elzarka | Brooklyn Defender Services | New York, NJ 07417, United States of America |
Laila Moussa Maher | COLUMBIA UNIVERSITY SCHOOL OF THE ARTS | New York, NJ 10027, United States of America |
Chuck Christopher English | RVM TECHNOLOGIES IN | New York, NY 10006-1705, United States of America |
Stephanie Anne Plana | MCGIVNEY, KLUGER & COOK | New York, NY 10004-2209, United States of America |
Laura Longwei Chao | Gunderson Dettmer Stough Villeneuve Franklin & Hachigian LLP | New York, NY 10036-7200, United States of America |
Daniel S. Weinstein | Proskauer Rose LLP | New York, NY 10036-6600, United States of America |
Sarah Elsheryie | Covington & Burling | New York, NY 10018, United States of America |
Curtis Blake Vella | Weil, Gotshal & Manges LLP | New York, NY 10153-0119, United States of America |
Find all attorneys in New York |
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Data Provider | New York State, Office of Court Administration |
Jurisdiction | New York State |
Related Datasets | New York State Corporations |
This dataset includes 357 thousand attorneys registered with New York State, Office of Court Administration. Each attorney is registered with registration number, full name, company name and address, phone number, email, year admitted, etc.