Scott Eric Bain (Reigstration# 4346961) is an attorney registered with New York State, Office of Court Administration. The admitted year is 2005.
Registration Number | 4346961 |
Full Name | SCOTT ERIC BAIN |
Law School | UNIVERSITY OF CALIFORNIA-BERKELEY |
Judicial Department of Admission | Third Department (seated in Albany) |
Year Admitted | 2005 |
Status | Currently registered |
Law School | UNIVERSITY OF CALIFORNIA-BERKELEY |
Name | Company / Organization | Address |
---|---|---|
Sergio Santos Do Nascimento | SERGIO BERMUDES ADVOGADOS | Sao Paulo Sp 01307-001, BRAZIL |
Elizabeth Ann Kostrzewa | Genesis Capital | Sherman Oaks, CA 91403-3197, United States of America |
Joseph Julius Kaufman | ||
Tobey Kearns Oliver | ||
Stanley Z. Cole |
Street Address |
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Name | Company / Organization | Address |
---|---|---|
Na Lyu | Shanghai Representative Office of Clifford Chance | Shanghai 200041, CHINA |
Xinyi Yu | Han Kun Law Offices | Beijing 100738, CHINA |
Gary Scott Hulsey | KOBRE & KIM LLC | Washington, DC 20036, United States of America |
John Anthony Carriel | Zelle LLP | Washington, DC 20006-4751, United States of America |
Xiang Zhou | Zeda Law Firm | Hang Zhou, CHINA |
Hong Zhang | United States District Court S.D.N.Y. | New York City, NY 10007, United States of America |
Ryan Edward Gallagher | Coughlin Duffy LLP | Morristown, NJ 07962, United States of America |
Hideyuki Matsumi | Hideyuki MATSUMI | Brussels 1000, BELGIUM |
Steven Keith Eisenberg | STERN & EISENBERG | Warrington, PA 18976-3403, United States of America |
Mellisa Ann Reilly | New York County District Attorney's Office | New York, NY 10013-4306, United States of America |
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Data Provider | New York State, Office of Court Administration |
Jurisdiction | New York State |
Related Datasets | New York State Corporations |
This dataset includes 357 thousand attorneys registered with New York State, Office of Court Administration. Each attorney is registered with registration number, full name, company name and address, phone number, email, year admitted, etc.