Mary Elaine Johnston (Reigstration# 2183010) is an attorney registered with New York State, Office of Court Administration. The admitted year is 1988.
Registration Number | 2183010 |
Full Name | MARY ELAINE JOHNSTON |
Company / Organization | ALLEN & OVERY LLP |
Address |
New York NY 10020-1001 United States of America |
County | New York |
Phone Number | (212) 610-6388 |
[email protected] | |
Law School | MICHIGAN |
Judicial Department of Admission | Third Department (seated in Albany) |
Year Admitted | 1988 |
Status | Currently registered |
Company / Organization Name | ALLEN & OVERY LLP |
Name | Company / Organization | Address |
---|---|---|
Brendan Lee Holman | ALLEN & OVERY LLP | New York, NY 10020-1001, UNITED STATES OF AMERICA |
Kayla Beth Epstein | ALLEN & OVERY LLP | New York, NY 10020-1001, UNITED STATES OF AMERICA |
Tiiu Lemsalu | Allen & Overy LLP | New York, NY 10020-1001, United States of America |
Sampada Bannurmath | Allen & Overy LLP | London, UNITED KINGDOM |
Nathanael John Kraintz | Allen & Overy LLP | New York, NY 10020-1005, United States of America |
Sagarikaseshna Sridhar | Allen & Overy LLP | New York, NY 10020-1001, United States of America |
Sebastian Mejia | Allen & Overy LLP | London E16ad, UNITED KINGDOM |
Andrew Elias Hashim | Allen & Overy LLP | London E1 6ad, UNITED KINGDOM |
Taylor Leigh Saviano | Allen & Overy LLP | New York, NY 10020-1001, United States of America |
Xinhe Ma | Allen & Overy LLP | Beijing 100004, CHINA |
Find all attorneys in ALLEN & OVERY LLP |
Law School | MICHIGAN |
Name | Company / Organization | Address |
---|---|---|
Charles Alex Gish | LATHAM & WATKINS | London Ec2m 3xf, UNITED KINGDOM |
Mariya Naulo | PAUL HASTINGS LLP | New York, NY 10166-0005, UNITED STATES OF AMERICA |
Rutherford Winslow Hubbard | FMO (the Dutch Development Bank) | Den Haag 2509 Ab, NETHERLANDS |
Daniel Eugene Free Jr | Holland & Hart LLP | Denver, CO 80202-3921, United States of America |
Steven Robert Schwartz | White & Case | New York, NY 10020-1001, United States of America |
Lucas Christopher Lux | San Francisco, CA 94105-1630, UNITED STATES OF AMERICA | |
Kohei Ishida | NISHIMURA & ASAHI LAW FIRM | Tokyo 100-8124, JAPAN |
Yonatan Berkovits | VICE MEDIA | Brooklyn, NY 11249-5119, UNITED STATES OF AMERICA |
Jonathan Henry Gaines | DECHERT, LLP | New York, NY 10036-6797, United States of America |
Nicholas Wassil Zabawsky | TAKE-TWO INTERACTIVE SOFTWARE, INC. | New York, NY 10036-4011, UNITED STATES OF AMERICA |
Find all attorneys from MICHIGAN |
Street Address |
|
City | NEW YORK |
State | NY |
Zip | 10020 |
Country | United States of America |
Name | Company / Organization | Address |
---|---|---|
William Benton Lewis Jr. | WEIL, GOTSHAL & MANGES LLP | New York, 10153 |
Kyle Donald Winnick | Chamberlain, Hrdlicka, White, Williams & Aughtry | New York, GA 30303, United States of America |
Noran Elzarka | Brooklyn Defender Services | New York, NJ 07417, United States of America |
Laila Moussa Maher | COLUMBIA UNIVERSITY SCHOOL OF THE ARTS | New York, NJ 10027, United States of America |
Chuck Christopher English | RVM TECHNOLOGIES IN | New York, NY 10006-1705, United States of America |
Stephanie Anne Plana | MCGIVNEY, KLUGER & COOK | New York, NY 10004-2209, United States of America |
Laura Longwei Chao | Gunderson Dettmer Stough Villeneuve Franklin & Hachigian LLP | New York, NY 10036-7200, United States of America |
Daniel S. Weinstein | Proskauer Rose LLP | New York, NY 10036-6600, United States of America |
Sarah Elsheryie | Covington & Burling | New York, NY 10018, United States of America |
Curtis Blake Vella | Weil, Gotshal & Manges LLP | New York, NY 10153-0119, United States of America |
Find all attorneys in NEW YORK |
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Data Provider | New York State, Office of Court Administration |
Jurisdiction | New York State |
Related Datasets | New York State Corporations |
This dataset includes 357 thousand attorneys registered with New York State, Office of Court Administration. Each attorney is registered with registration number, full name, company name and address, phone number, email, year admitted, etc.